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WO/1987/003683A1 |
A shearing phase difference sensor including a high energy laser source for generating adjacent coherent light beams. Samples of the beams are extracted by an extracter and directed to an optical modifier. The optical modifier, positione...
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WO/1987/002768A1 |
An adaptive laser system (10) incorporates a laser (12) and a novel system and method for determining the slope distribution of a laser beam wavefront. The sensor comprises a ramp filter (16) with a continuous monotonically varying trans...
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WO/1987/002785A1 |
An adaptive laser system (10) includes an adaptable laser (12), a waveform sensor (14), an amplitude distribution sensor (16), and a processor (18) for converting data from the sensors into commands for controlling the waveform of a lase...
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WO1987002785A2 |
An adaptive laser system (10) includes an adaptive laser (12), a waveform sensor (14), an amplitude distribution sensor (16), and a processor (18) for converting data from the signals. sensors into laser beam waveform control instruction...
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WO/1987/001438A1 |
A common optical path interferometric gauge comprises an optical beam (14) that is split into two beams. Both beams are modulated and recombined after introducing an optical path length difference greater than the coherence length of the...
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WO/1986/007162A1 |
A spectral analyzer and direction indicator system (10) includes optical channels (20, 30, 40) for providing detected optical information indicative of incidence direction and spectral content of incident radiation. Each optical channel ...
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WO/1986/006481A1 |
An interference polarization refractometer comprises a polarized emission source (1) and, located consecutively one after another along the emission path, a means for the light beam splitting into two orthogonally polarized light beams, ...
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WO/1986/003844A1 |
Spectral analyzer and direction indicator systems (10, 20, 30, 40, 50) include optical elements (11, 17, 27b, 33b, 35b, 39b) for providing optical information which depend on incidence direction and spectral content, and further includes...
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WO/1986/001301A1 |
A spectral analyzer and direction indicator (10, 20) and includes reflection gratings (13, 15, 25, 27, 37, 39), associated optical systems (17, 19, 29, 33, 41, 45) and associated detectors (21, 23, 31, 35, 43, 47, 30). The reflection gra...
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WO/1985/003122A1 |
An interferometric spectrometer utilizing a multiple array detector (22). When the spectrometer utilizes visible light a photodiode array detector (22) is utilized and a fixed tilted mirror (17) and vertical mirror (16) in combinations w...
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WO/1985/000221A1 |
An optical interferometer matrix which includes a reference waveguide (10) for optically transmitting a reference signal. The optical interferometer matrix further includes a signal source waveguide (12) for optically transmitting a sour...
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WO/1984/003558A1 |
An improved mirror scan control for driving a movable mirror (14) in an interferometer with a constant scan velocity comprises a closed loop servo control which provides constant velocity mirror scan in response to a phase comparison of ...
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WO/1983/003685A1 |
A closed loop optical fiber interferometer is used in sensing a quantity, Q, by applying a time varying or modulated measure of, Q, asymmetrically to the closed loop (72) and detecting phase shift between two counterpropagating optical s...
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WO/1981/001466A1 |
Method and apparatus for measuring the frequency of radiation comprising a pair of filters (2, 3) or a beam splitter (30) responsive to radiation from a source of radiation (4) for providing a first output having a magnitude which increa...
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WO/1981/000299A1 |
An interference spectrometer in which a wedge-shaped prism (32) is moved across one arm (22) of an interferometer for variation of the path difference, and where the beam splitter substrate (36) and prism (32) are optically compensated f...
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JP7483136B1 |
Depending on the light source (1) that emits light and the quantum state of the light emitted from the light source (1), the light emitted from the light source (1) is transferred to the first environment system (21) and the measurement ...
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JP2024063855A |
An object of the present invention is to measure with high precision the amount of phase shift of light that passes through different refractive index regions. A phase difference measuring device 1 includes an irradiation section 10, a s...
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JP7481351B2 |
A device for analysing a wavefront may be connected to a fluorescence microscopy imaging system with optical sectioning, equipped with a microscope objective including a pupil in a pupil plane, the analysis device including a two-dimensi...
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JP2024063078A |
The present invention provides a wavefront measurement device that has appropriate resolution while suppressing the size of a light receiving section. [Solution] A wavefront measurement device (1) includes a deflection unit (80) that def...
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JP7478026B2 |
To provide an optical modulator capable of realizing a function that has been conventionally achieved by a combination of plural optical elements by a single element.In an optical modulator, 16 areas (4×4) are set to be a repletion unit...
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JP2024057657A |
An object of the present invention is to provide a wavefront measuring device capable of measuring the transmitted wavefront of an optical system to be measured with a small and simple configuration, regardless of the focal length of the...
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JP2024047560A |
A non-interferential, non-iterative complex amplitude reading method and apparatus of the present invention is capable of detecting complex amplitude information, that is, amplitude and phase, from a single diffraction image based on an ...
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JP7461498B2 |
Provided are a device (4) and a method for online measuring a spectrum for a laser device. The device (4) for online measuring a spectrum for a laser device includes: a first optical path assembly (G1) and a second optical path assembly ...
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JP7461497B2 |
According to the present disclosure, there is provided a device (2) and a method for measuring a wavelength for a laser device. The device (2) for measuring a wavelength for a laser device includes: a first optical path assembly and a se...
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JP7446911B2 |
To provide a wavefront measurement device which has appropriate resolution while suppressing the size of a light reception part.A wavefront measurement device (1) includes: deflection parts (80, 81) for deflecting light which has been em...
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JP2024510545A |
In a general aspect, a method for increasing measurement accuracy of an optical instrument is presented. The method includes determining a measurement of an optical property measured by an optical instrument based on the optical data and...
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JP2024030561A |
The present invention provides a measurement system and method for measuring the spectral intensity and spectral phase of an optical pulse while reducing the influence of phase fluctuations of a modulated signal. According to one aspect ...
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JP7432227B2 |
A spatial modulator is provided on a plane conjugate to a sample plane on which a sample is to be placed. The spatial modulator spatially modulates illumination light irradiated to the sample 2 or object light that has passed through or ...
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JP7429691B2 |
A metrology system includes a first beam analysis system for analyzing at least one first measurement beam that was coupled from the excitation laser beam before a reflection on the target material and a second beam analysis system for a...
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JP7420140B2 |
A photoelectric conversion apparatus includes an interferometer configured to cause interference in wavelength swept light Lx output from a wavelength swept light source X and is configured to convert the interfered wavelength swept ligh...
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JP2024501712A |
A wavelength measurement chip (11) is provided. The wavelength measuring chip (11) includes an optical splitter (112) configured to receive the first electromagnetic wave signal and split the first electromagnetic wave signal into two el...
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JP7402243B2 |
A radiation measurement system (200) comprising an optical apparatus (205) configured to receive a radiation beam (210) and change an intensity distribution of the radiation beam to output a conditioned radiation beam (215), and a spectr...
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JP7397427B2 |
To provide an art that resolves an indefiniteness problem of a phase without processing of a sample, and highly accurately measures a real part and imaginary part of a complex refractive index of a measurement object and a thickness ther...
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JP7373399B2 |
The present invention relates to a method comprising reception of an incident electromagnetic wave (9) by a diffractive element (2) and conversion of this incident electromagnetic wave (9) into a diffracted electromagnetic wave (10) by t...
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JP7370544B2 |
To provide an optical frequency measurement device capable of highly accurately measuring optical frequency of a target laser without requiring a highly accurate reference light source.An optical frequency identification unit 70 changes ...
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JP2023157644A |
To provide a wave front measuring device and a wave front measuring method that can measure, with a simple configuration, wave fronts of rays of light with a plurality of wavelengths at the same time.A wave front measuring device has: a ...
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JP2023155749A |
To extract a non-eccentric component of error in an object under inspection from information on transmitted wavefronts having various wavefront shapes, not limited to perfect circular shapes.An analysis method disclosed herein comprises ...
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JP7341754B2 |
To provide a measuring apparatus capable of preventing accumulation of measurement errors in a wavelength compensator even if operated for a long period of time.A measuring apparatus includes: a wavelength compensator; environment measur...
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JP2023115855A |
To provide a wavefront sensor capable of detecting accurately, a centroid, even in a wavefront with large aberration.A wavefront sensor 100 comprises: a micro lens array 101 including a plurality of micro lenses; and an imaging element 1...
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JP2023115859A |
To provide a phase measurement method that can measure a variety of amounts of phase shift with a simple configuration.A phase measurement method includes: a changing step of changing an illumination area of a specimen illuminated with i...
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JP7322683B2 |
To provide an image generation device for a nerve cell.An image generation device 40 includes: a phase calculation unit for calculating the phase of light that has passed through each object S on an object-by-object basis on the basis of...
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JP2023106196A |
To provide an optical pulse meter which can reduce a measurement time.An optical pulse meter 100 comprises: a wavelength variable filter 13 capable of successively changing the transmission wavelength band of first light to be measured t...
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JP7315928B2 |
To provide a light signal sampling device and a light signal sampling method that can faithfully measure a time waveform of a light signal over a wide band.A light signal sampling device comprises: an optical frequency comb 11a which gen...
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JP7306907B2 |
To provide a phase measurement device and a phase compensation apparatus which can highly accurately obtain the optimum solution for compensating for the initial phase of a multi-light guide and compensate for the initial phase of the mu...
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JP2023090091A |
To provide a wavefront measurement device and a wavefront measurement method capable of both expanding a dynamic range and improving spatial resolution.A wavefront measurement device 1 comprises: a phase modulation section 2 having a spa...
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JP2023524907A |
In a general aspect, the wavelength of light is measured. In some aspects, the wavelength measurement system includes an interferometer, camera system, sensor, and control system. An interferometer includes two reflective surfaces and a ...
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JP2023079493A |
To precisely measure phase variation of guided light propagating in each channel in an optical phased array.A phase measuring device 1 includes: an output light acquisition unit 3 that acquires outgoing light from an optical phased array...
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JP7284741B2 |
The interferometer 10 according to this disclosure includes: a first optical component 12 that splits each of the P polarization component and the S polarization component of the light to be measured into the first optical path R1 and th...
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JP2023070071A |
To provide a technique for measuring a sample with higher accuracy while reducing time and effort of adjustment.An optical measurement method includes the steps of: configuring an optical system for recording a hologram generated by modu...
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JP7274234B2 |
An electromagnetic wave phase/amplitude generation device includes a radiation unit configured to radiate electromagnetic waves of a random radiation pattern on a spatial frequency in which a state of the electromagnetic waves to be radi...
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