Title:
【発明の名称】分散されていない不純物のための分散系を監視する方法およびこの方法を実施するための装置
Document Type and Number:
Japanese Patent JP2000505552
Kind Code:
A
Abstract:
The invention relates to a process for monitoring a disperse system for non-dispersed impurities (16) before processing of said system into an end product. During said process, part of the disperse system is extruded before processing to form a strip (7) and the impurities in said strip are detected. To this end, weak X-rays are beamed through small areas of the strip (7) continuously or gradually and at right angles to the strip plane. The X-rays emerging from the areas of the strip through which they have passed are subsequently detected in areas. The type, number, size, shape and/ or distribution of the impurities (16) are determined by the detected rays. It is particularly advantageous that impurities inside the strip and also on the surface thereof are detected as a result of X-rays passing through the strip (7). If the impurities (16) exceed a predetermined threshold, the disperse system does not undergo further processing.
Inventors:
Freddy, Stutsky
Application Number:
JP53048797A
Publication Date:
May 09, 2000
Filing Date:
February 21, 1997
Export Citation:
Assignee:
Borealis, Actieselsk
International Classes:
C08J5/18; G01N23/04; G01N23/12; G01N23/14; G01N23/18; (IPC1-7): G01N23/12; G01N23/04; G01N23/14
Attorney, Agent or Firm:
Kazuo Sato (3 others)