Title:
【発明の名称】マルチポートデバイス解析装置と解析方法及びそのマルチポートデバイス解析装置の校正方法
Document Type and Number:
Japanese Patent JP2002536645
Kind Code:
A
Abstract:
A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a signal source ( 112 ) for providing a test signal to one of terminals of a multi-port device under test (DUT); a plurality of test ports (P 1 -Pn) for connecting all of the terminals of the multi-port DUT to the corresponding test ports; a plurality of measurement units (MU 1 -MUn) for measuring signals from the corresponding test ports; a reference signal measurement unit (R) for measuring the test signal for obtaining reference data; a plurality of terminal resistors (TR 1 -TRn) each being assigned to one of the test ports; and switch means (SW 1 -SWn) for selectively providing the test signal to one of the test ports (input port) and disconnecting the terminal resistor from the input port while connecting the terminal resistors to all the other test ports; wherein parameters of the multi-port DUT are acquired without changing the connections between the test ports and the terminals of the DUT, while changing selection of the test port until all of the test port being assigned as the input port.
Inventors:
Yoshikazu Nakayama
Hirotaka Gada
Iida Minoru
Hirotaka Gada
Iida Minoru
Application Number:
JP2000597641A
Publication Date:
October 29, 2002
Filing Date:
February 07, 2000
Export Citation:
Assignee:
Advantest Corporation
Advantest America R&D Center, Inc.
Advantest America R&D Center, Inc.
International Classes:
G01R35/00; G01R27/28; (IPC1-7): G01R27/28; G01R35/00
Attorney, Agent or Firm:
Kusano Taku (1 person outside)