Title:
電子システム集合の診断方法
Document Type and Number:
Japanese Patent JP2006515089
Kind Code:
A
Abstract:
The method for diagnosing defaults in the functioning of electronic component systems in which during a system design phase, values associated with system components are assigned to different categories. The values are associated with the availability of components, faults associated with the failure of a particular actuator or sensor, connection faults, processor faults and values relating to the failure of execution of a microcontroller program.
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Inventors:
Boutin samuel
Application Number:
JP2004563293A
Publication Date:
May 18, 2006
Filing Date:
December 19, 2003
Export Citation:
Assignee:
Renault S Ares
International Classes:
G06F11/22; G05B23/02; G06F17/10; G06F17/18; B60R16/02; G01M17/007
Attorney, Agent or Firm:
Shigeru Kobayashi
Yoshihiko Izumi
Yoshihiko Izumi