Title:
ナノ構造の変形、破壊、および変換に基づくモニタリング装置およびモニタリング方法
Document Type and Number:
Japanese Patent JP2013504442
Kind Code:
A
Abstract:
A large number of properties of nanostructures depend on their size, shape and many other parameters. As the size of a nanostructure decreases, there is a rapid change in many properties. When the nanostructure is completely destroyed, those properties essentially disappear. Systems based on changes in properties of nanostructures due to the destruction of nanostructures are proposed. The systems can be used for monitoring the total exposure to organic, inorganic, organometallic and biological compounds and agents using analytical methods.
Inventors:
Patel, Gordham Bhuhai
Application Number:
JP2012528925A
Publication Date:
February 07, 2013
Filing Date:
September 10, 2010
Export Citation:
Assignee:
JP Laboratories, Inc.
International Classes:
B82Y35/00; B82B1/00
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Attorney, Agent or Firm:
Hatta International Patent Corporation