Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION SYSTEM, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
Japanese Patent JP2018136734
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To precisely determine abnormalities of fans without reducing the cooling performance even in a layout of fans that triggers corotation.SOLUTION: Disclosed is an abnormality determination device for determining abnormalities of a plurality of second fans provided in a position to corotate by a first fan, which: compares the rotation frequencies of the plurality of second fans; and determines, when any deviation is observed in the rotation frequencies amongst the second fans, that the plurality of second fans have caused abnormalities.SELECTED DRAWING: Figure 1
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Inventors:
ETO JUN
Application Number:
JP2017030715A
Publication Date:
August 30, 2018
Filing Date:
February 22, 2017
Export Citation:
Assignee:
NEC PLATFORMS LTD
International Classes:
G06F1/20; H05K7/20
Domestic Patent References:
JPH04198868A | 1992-07-20 | |||
JP2010272704A | 2010-12-02 | |||
JPH07287625A | 1995-10-31 |
Attorney, Agent or Firm:
Sumio Tanai
Ryuichiro Mori
Yasushi Matsunuma
Eisuke Ito
Ryuichiro Mori
Yasushi Matsunuma
Eisuke Ito