Title:
DEFECT DISCRIMINATION DEVICE, DEFECT DISCRIMINATION METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2018174450
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To identify a defect point easily.SOLUTION: A defect discrimination device includes a recording section 81 for recording measured values of test items at the time of a shipment test, and adjustment values of shipping items at the time of the shipment, collection sections 82, 83 for collecting data corresponding to the test items after a startup, a shipment test value comparison section 612 for comparing the data corresponding to the test items with the measured value of the test items recorded in the recording section, a shipment adjustment value comparison section 613 for comparing the data corresponding to the shipping items with the adjustment value of the shipping items recorded in the recording section 81, and a characteristic fluctuation determination section 616 for determining that characteristics of a device for determining the data corresponding to the test item, or the characteristics of the device for determining the data corresponding to the shipping items, is fluctuated, when the data corresponding to the test items after the startup is fluctuated comparing with the measured value of the test items, or when the data corresponding to the shipping items after the startup is fluctuated comparing with the adjustment value of the shipping items.SELECTED DRAWING: Figure 6
More Like This:
| JPH11355739 | TWO-WAY AMPLIFIER FOR CATV |
| JP2011249973 | DEMODULATION CIRCUIT |
| JP3127546 | LIGHT TRANSMITTING CIRCUIT |
Inventors:
YAMAMOTO KOKI
Application Number:
JP2017071486A
Publication Date:
November 08, 2018
Filing Date:
March 31, 2017
Export Citation:
Assignee:
NEC CORP
International Classes:
H04B10/07
Attorney, Agent or Firm:
Akio Miyazaki
Masaaki Ogata
Masaaki Ogata