Title:
【発明の名称】測定装置と共に用いられるプローブ
Document Type and Number:
Japanese Patent JP2840725
Kind Code:
B2
Abstract:
PCT No. PCT/GB89/00786 Sec. 371 Date Feb. 13, 1990 Sec. 102(e) Date Feb. 13, 1990 PCT Filed Jul. 10, 1989 PCT Pub. No. WO90/00716 PCT Pub. Date Jan. 25, 1990.A hinge probe is described (see FIG. 1) in which a plurality of plates (4,10,45,46,47) are stacked in the direction of the probe axis (11). The plates are connected together in pairs by hinge means (12,50,52 and 53), various forms of which are described, which define pivot axes and which constrain each pair of plates for relative pivoting movement about a side edge of the pair. The pivot axes are arranged to be mutually orthogonal to enable tilting of a stylus (2), attached to one of the plates (4), in any direction by pivoting of one or more of the plates when a force is applied to the stylus. An axial rest position for each movable plate on an adjacent plate is defined in combination with the hinge by a further support (14,16) disposed between each pair of plates on the opposite side of the probe axis (11) to the respective pivot axis. A spring (17) urges the plates into their respective rest positions. Constraint against relative transverse movements of the plates of a pair is provided in addition to that provided by the hinge, if any, by a planar spring (20), or other devices. Thus the hinge can be made quite flexible while maintaining an accurate rest position for the stylus to which it returns when any tilting force has been removed, and the force required to remove the stylus from its rest position is minimized.
Inventors:
MAKUMAATORII DEIBITSUDO ROBAATSU
Application Number:
JP50788989A
Publication Date:
December 24, 1998
Filing Date:
July 10, 1989
Export Citation:
Assignee:
RENISHO PLC
International Classes:
G01B5/012; G01B7/00; G01B5/20; G01B7/012; (IPC1-7): G01B7/00; G01B5/20
Domestic Patent References:
| JP5963501A | ||||
| JP60138410A |
Other References:
【文献】米国特許4734994(US,A)
Attorney, Agent or Firm:
Yoshikazu Tani