Title:
【発明の名称】ランダムアクセスメモリの試験の方法
Document Type and Number:
Japanese Patent JP2910692
Kind Code:
B2
Inventors:
SHIMIZU HIDEKAZU
Application Number:
JP23357396A
Publication Date:
June 23, 1999
Filing Date:
August 15, 1996
Export Citation:
Assignee:
NIPPON DENKI KK
International Classes:
G06F12/16; G06F11/10; G11C29/00; G11C29/42; (IPC1-7): G11C29/00; G06F11/10; G06F12/16
Domestic Patent References:
| JP6267942A | ||||
| JP63261926A | ||||
| JP561777A | ||||
| JP612273A |
Attorney, Agent or Firm:
Asato Kato