Title:
【発明の名称】電子部品観測用プロ-ブ及び方法
Document Type and Number:
Japanese Patent JP2972615
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To prevent malfunction in observation due to shaking of a probe or erroneous contact to a terminal when observing an LSI terminal. SOLUTION: A body of an LSI is nipped by a fixing hook 2 and a fixing fin 6 and the body 1 is tightened by a spring to be fixed to the LSI. At the same time, a connection pin 5 is pressed against a terminal of the LSI by a spring 4 at an adequate pressure. The terminal of the LSI to be observed is separated from the other adjacent terminals by the fixing fin 6, thereby preventing malfunction due to shaking of a probe or erroneous contact thereof.
Inventors:
KIKUCHI TAKAHIRO
Application Number:
JP34781296A
Publication Date:
November 08, 1999
Filing Date:
December 26, 1996
Export Citation:
Assignee:
TOHOKU NIPPON DENKI KK
International Classes:
G01R1/073; G01R31/26; (IPC1-7): G01R1/073; G01R31/26
Domestic Patent References:
| JP8179003A | ||||
| JP1318978A | ||||
| JP293767U | ||||
| JP174571U | ||||
| JP62160378U |
Attorney, Agent or Firm:
Naoki Kyomoto (2 outside)