Title:
【発明の名称】適応不均一性補償アルゴリズム
Document Type and Number:
Japanese Patent JP3417573
Kind Code:
B2
Abstract:
An adaptive method for removing fixed pattern noise from focal plane array (FPA) imagery. A set of correction terms is applied to the focused image from the FPA, and a filter is applied to the corrected, focused image. The set of correction terms is also applied to a blurred version of the FPA image, and the filter is applied to the corrected, blurred image. Fixed pattern noise errors are then calculated using the filtered imagery, and employed to update the correction terms. The updated correction terms are then used for processing the next image. In one embodiment, the filter is an anti-median filter. In another embodiment, the filter is an anti-mean filter.
Inventors:
Kill Goal, Patrick M
Application Number:
JP54432798A
Publication Date:
June 16, 2003
Filing Date:
April 15, 1998
Export Citation:
Assignee:
Raytheon Company
International Classes:
G01J1/44; G06T5/20; G06T5/50; H04N5/33; H04N5/365; (IPC1-7): H04N5/335; G01J1/44; H04N5/33
Domestic Patent References:
| JP7222059A | ||||
| JP5292403A | ||||
| JP2206976A | ||||
| JP453373U |
Attorney, Agent or Firm:
Takehiko Suzue (4 outside)