Title:
ディフラクトグラムによる無標準相分析法
Document Type and Number:
Japanese Patent JP4115542
Kind Code:
B2
Abstract:
A method of determining the concentrations of the constituents in a mixture of substances by way of an X-ray diffractogram of the mixture. The fundamental difficulty that it is not possible to determine the entire power spectrum (PS) of the diffraction is avoided by making a suitable estimate of the PS on the basis of the diffractions that can be observed. Using an estimate of the dispersive power of the individual atoms in the unity cells of the constituents and the PS, the absolute intensities are determined from the relative intensities and on the basis thereof the concentrations of the constituents in the mixture are determined.
Inventors:
Lehman, Delk
Application Number:
JP53352399A
Publication Date:
July 09, 2008
Filing Date:
December 14, 1998
Export Citation:
Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
G01N23/207; G01N23/20
Domestic Patent References:
| JP9178675A | ||||
| JP7174720A | ||||
| JP3226580A | ||||
| JP5067599A |
Foreign References:
| US4592082 | ||||
| US4991191 |
Other References:
L. S. ZEVIN, ”A method of Quantitative Phase Analysis without Standards”, Journal of Applied Crystallography, INTERNATIONAL UNION OF CRYSTALLOGRAPHY, 1977年 6月 1日, 第10巻、Part 3,p.147-150
Attorney, Agent or Firm:
Tadahiko Ito