Title:
シングルビーム型の分光計及びシングルビーム型の分光計の操作方法
Document Type and Number:
Japanese Patent JP4124912
Kind Code:
B2
Abstract:
Background profiles for spectrometers are obtained by recording a number of background measurements over a period of time and analysing the measured data to create a statistical model of the instrument. The result is a set of stored background profiles with low noise level which are available when a sample measurement is made. The operator does not have to allow time to collect a background measurement as is the case in conventional techniques.
Inventors:
Richard Anthony Sprag
Application Number:
JP15363799A
Publication Date:
July 23, 2008
Filing Date:
June 01, 1999
Export Citation:
Assignee:
Perkin-Elmer Limited
International Classes:
G01J3/45; G01N21/27; G01J3/28
Domestic Patent References:
| JP6502492A | ||||
| JP3226632A | ||||
| JP7209082A | ||||
| JP6347625A | ||||
| JP6105220B2 | ||||
| JP6502247A | ||||
| JP3504769A | ||||
| JP8505221A | ||||
| JP1113637A |
Foreign References:
| US5291426 | ||||
| WO1997028438A1 | ||||
| US4827132 | ||||
| WO1997018566A1 | ||||
| WO1996018881A1 | ||||
| WO1997004299A1 |
Attorney, Agent or Firm:
Toshio Yano
Toshiomi Yamazaki
Takuya Kuno
Toshiomi Yamazaki
Takuya Kuno
Previous Patent: JPH04124911
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