Title:
セラミック表面載置装置及び他の電子コンポーネントをテストするための接触子アセンブリ
Document Type and Number:
Japanese Patent JP4184977
Kind Code:
B2
Abstract:
A multi point contactor (MPC) on a component testing system for electrically contacting a terminal on a device under test (DUT) includes at least three independently moveable contacts to help insure at least two of them contact the DUT terminal. At least one of the contacts includes an integral spring, preferably in the form of a blade laser machined from a sheet of electrically conductive material to include a first portion for bearing against the contact-holding structure, a second portion for bearing against the terminal on the DUT, and a third portion interconnecting the first and second portions that functions as an integral spring bias for spring biasing the second portion from the first portion toward the terminal on the DUT. Preferably, the third portion of the blade has a serpentine shape that consistently results in desired constant-force spring characteristics over a nominal range of blade travel.
Inventors:
Christina Ale Solne
James Ziegask
Manuel Agarad
James Ziegask
Manuel Agarad
Application Number:
JP2003577284A
Publication Date:
November 19, 2008
Filing Date:
January 22, 2003
Export Citation:
Assignee:
Ceramic Component Technologies, Inc.
International Classes:
G01R1/04; G01R1/073
Domestic Patent References:
| JP10148651A | ||||
| JP10132853A |
Foreign References:
| US3812311 | ||||
| US3812311 |
Attorney, Agent or Firm:
Toru Tanabe