To provide a compact transmission electron microscope allowing a fluorescent plate to be disposed on an optical axis of an electron beam and to be retreated from the electron beam optical axis.

When a TEM image observed on the fluorescent plate 11 is photographed by using a photographic film 12, the fluorescent plate 11 is retreated from the electron beam optical axis O. In evacuating the fluorescent plate 11, a fluorescent plate support part 14a is rotated counterclockwise (counterclockwise in view from the side of a fluorescent plate driving part 14b) around a driving axis (r) by the fluorescent driving part 14b as shown by a dotted line in Figure (c). In this case, it is rotated by around 90°. As a result, the fluorescent plate 11 fixed to a tip of the crank-like fluorescent plate support part 14a is evacuated from the electron beam optical axis O by moving it on a circumference S around the driving axis (r) as shown by the dotted line in Figure (c).

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