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Title:
レーザ計測方法、レーザ状態検知機器およびレーザ状態検知システム
Document Type and Number:
Japanese Patent JP4432084
Kind Code:
B2
Abstract:

To provide laser condition detection equipment capable of detecting highly reliably a condition using a self-coupling effect of a semiconductor laser element.

This laser condition detection equipment for analyzing an irradiation beam superposed with an interference signal generated by the self-coupling effect in the semiconductor laser element to detect a condition up to a measuring object, using the semiconductor laser element for emitting a wavelength-modulated laser beam toward the measuring object, and for introducing the laser beam reflected by the measuring object, is provided, in particular, with a condition detecting photoreceiver provided to receive only the irradiation beam emitted from the laser element, and an object detecting photoreceiver provided to receive only the reflected beam by the object.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
Yuichi Nakajima
Tatsuya Ueno
Application Number:
JP2005301727A
Publication Date:
March 17, 2010
Filing Date:
October 17, 2005
Export Citation:
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Assignee:
YAMATAKE CORPORATION
International Classes:
G01V8/12; G01B11/00; G01S17/32; H01S3/00
Domestic Patent References:
JP10246782A
JP7005242A
JP11287859A
JP8075451A
Attorney, Agent or Firm:
Koji Nagato
Junichi Yamanaka