Title:
試料表面の電子エネルギ準位の測定方法
Document Type and Number:
Japanese Patent JP4576520
Kind Code:
B2
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Inventors:
Toyoko Arai
Masahiko Tomitori
Masahiko Tomitori
Application Number:
JP2000217532A
Publication Date:
November 10, 2010
Filing Date:
July 18, 2000
Export Citation:
Assignee:
National University Corporation Japan Advanced Institute of Science and Technology
International Classes:
G01B21/30; G01Q60/26; G01Q20/04; G01Q30/04; G01Q60/00; G01Q60/24; G01Q60/32; G01Q80/00
Domestic Patent References:
| JP2000028625A |
Other References:
R.M Tromp, R.J. Hamers, J.E. Demuth,Surface Studies with the Scanning Tunneling Microscope,応用物理,1987年,第56巻 第2号,199-205頁
Attorney, Agent or Firm:
Keiichiro Saikyo
Takeshi Sugiyama
Takeshi Sugiyama