Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
多接合型光電変換素子試験セルの特性測定方法及び近似太陽光光源のスペクトル調整方法
Document Type and Number:
Japanese Patent JP4613053
Kind Code:
B2
Abstract:

To provide a method of correctly measuring the photoelectric transfer characteristics in standard conditions of a group of a multi-junction solar cell, having variations in relative spectral sensitivity of element cells which is manufactured in a production line.

The method of measuring the characteristics of a multi-junction photoelectric conversion element performs the lamination of the plurality of element cells and measures the characteristics of the multi-junction photoelectric conversion element testing cell measured under the approximate sunlight optical source. The method of measuring the characteristics of the multi-junction photoelectric conversion element includes a step of acquiring reference characteristics which are the characteristics under the standard conditions of the reference cells of a plurality of configurations equivalent to the testing cell, a step of setting the conditions of an approximate sunlight optical source so that the reference characteristics of the plurality of reference cells are acquired, and a step of measuring the output characteristics of the testing cell under the approximate sunlight optical source after the conditioning is set.

COPYRIGHT: (C)2006,JPO&NCIPI


Inventors:
Akihiko Nakashima
Masahiro Goto
Application Number:
JP2004334243A
Publication Date:
January 12, 2011
Filing Date:
November 18, 2004
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Kaneka Corporation
International Classes:
H01L31/04
Domestic Patent References:
JP2002111030A
JP2002111029A
JP63076381A
Attorney, Agent or Firm:
Takashi Fujita



 
Previous Patent: JPS4613052

Next Patent: JPS4613054