Title:
建物変形解析装置
Document Type and Number:
Japanese Patent JP4648590
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To improve analytical efficiency at less expense in time and effort while keeping analytical accuracy. SOLUTION: In an analytical method for building deformation analyzing a relationship between external forces P acting on a building and deformations εof the building due to the forces P in regard to the building composed of a plurality of structural components, after calculating yield forces P and deformations ε of the components at every component, deformation analyses of the building are performed by giving analytical conditions of yields at every plurality of the components in increasing order of the yield forces P acting on the components, so that a load deformation curve accompanied by the deformation analysis is composed of bending lines setting bending points between a maximum value and a minimum value of each yield force P at yield times when the plurality of the components yield simultaneously.
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Inventors:
Kimiki Hatanaka
Satoshi Kusaka
Takashi Kashima
Hidemi Ikeda
Yoshinori Matsubara
Kazuki Umebayashi
Kaoru Otani
Takashi Oshima
Hirayama Forge
Shunji Yamamoto
Yokonami Tsutomu
Suzuki Atsuo
Aoki Tadataka
Satoshi Kusaka
Takashi Kashima
Hidemi Ikeda
Yoshinori Matsubara
Kazuki Umebayashi
Kaoru Otani
Takashi Oshima
Hirayama Forge
Shunji Yamamoto
Yokonami Tsutomu
Suzuki Atsuo
Aoki Tadataka
Application Number:
JP2001227609A
Publication Date:
March 09, 2011
Filing Date:
July 27, 2001
Export Citation:
Assignee:
TAKENAKA CORPORATION
International Classes:
E04B1/00; G06F17/50
Domestic Patent References:
| JP10320432A | ||||
| JP5113054A | ||||
| JP11337651A |
Attorney, Agent or Firm:
Shuichiro Kitamura