Title:
質量分析計
Document Type and Number:
Japanese Patent JP4778564
Kind Code:
B2
Abstract:
A method is disclosed of identifying parent ions by matching daughter ions found to be produced at substantially the same time that the parent ions elute from a mixture. Ions emitted from an ion source (1) are transmitted to a fragmentation device (4) comprising an Electron Capture Dissociation, an Electron Transfer Dissociation or a Surface Induced Dissociation fragmentation device. The fragmentation device (4) is alternately and repeatedly switched between a first mode wherein the ions are substantially fragmented to produce daughter ions and a second mode wherein the ions are not substantially fragmented. Mass spectra are taken in both modes. At the end of an experimental run parent and daughter ions are recognized by comparing the mass spectra obtained in the two different modes. Daughter ions are matched to particular parent ions on the basis of the closeness of fit of their elution times, and this enables parent ions then to be identified.
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Inventors:
Bateman, Robert, Harold
Application Number:
JP2008541818A
Publication Date:
September 21, 2011
Filing Date:
November 23, 2006
Export Citation:
Assignee:
Micromass U.K. Limited
International Classes:
H01J49/26; G01N27/62; H01J49/06; H01J49/10
Domestic Patent References:
| JP2002100318A | 2002-04-05 | |||
| JP2007529014A | 2007-10-18 | |||
| JP2006526265A | 2006-11-16 | |||
| JP2004281350A | 2004-10-07 | |||
| JP2005235412A | 2005-09-02 | |||
| JP2005524196A | 2005-08-11 |
Foreign References:
| WO2005090978A1 | 2005-09-29 | |||
| WO2004008481A1 | 2004-01-22 |
Attorney, Agent or Firm:
Ikeuchi, Sato & Partners