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Patent Searching and Data


Title:
医用装置及び検査プロトコル取得方法
Document Type and Number:
Japanese Patent JP4783127
Kind Code:
B2
Abstract:

To provide a method by which a desired inspection protocol can be easily obtained out of inspection protocols registered in a database.

The medical apparatus having a medical inspection device 1a and a medical managing device providing the inspection protocols including at least conditions for inspecting by the medical inspection device photographing a subject comprises a protocol database 17a which stores the plurality of inspection protocols along with and corresponding to their using result information or estimating information, a protocol searching means 13a searching the inspection protocols stored in the protocol database according to the searching request from the medical inspection device, and a first graph forming means 14a forming graphs from the using result information or the estimating information of the plurality of inspection protocols searched according to the searching request from the medical inspection device, so that the inspection protocols can be selected from the graphs by the medical inspection device.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
Owaki Naoki
Youichi Takada
Application Number:
JP2005340259A
Publication Date:
September 28, 2011
Filing Date:
November 25, 2005
Export Citation:
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Assignee:
Toshiba Corporation
Toshiba Medical Systems Corporation
International Classes:
A61B5/00; A61B5/055; G16H10/60
Domestic Patent References:
JP2001149354A
JP2005182633A
JP2003052660A
Attorney, Agent or Firm:
Misawa patent office
Masayoshi Misawa