Title:
光干渉断層画像表示システム
Document Type and Number:
Japanese Patent JP4898263
Kind Code:
B2
Inventors:
Chung Chang Ho
Application Number:
JP2006106093A
Publication Date:
March 14, 2012
Filing Date:
April 07, 2006
Export Citation:
Assignee:
Suntech Co., Ltd.
International Classes:
G01N21/17; H01S5/183
Domestic Patent References:
| JP2004273906A | ||||
| JP2004072118A | ||||
| JP2005321385A | ||||
| JP2005156540A |
Foreign References:
| WO2004093272A2 | ||||
| US7701588 |
Other References:
B.Golubovic,他,“Optical frequency-domain reflectomtry using rapid wavelength tuning of a Cr4+:forsterite laser”,OPTICS LETTERS,1997年11月15日,Vol.22, No.22,pp.1704-1706
M.A.Choma,他,“Sensitivity advantage of swept source and Fourier domain optical coherence tomography”,OPTICS EXPRESS,2003年 9月 8日,Vol.11, No.18,pp.2183-2189
M.A.Choma,他,“Sensitivity advantage of swept source and Fourier domain optical coherence tomography”,OPTICS EXPRESS,2003年 9月 8日,Vol.11, No.18,pp.2183-2189
Attorney, Agent or Firm:
Yoshiki Okamoto