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Title:
誤り率測定システム
Document Type and Number:
Japanese Patent JP5016651
Kind Code:
B2
Abstract:

To reduce time for measuring an error rate by minimizing an overhead.

An external processor 10 transmits a package command, where commands for testing to be transmitted have been packaged into one package command, by one telegram. An error rate measuring device 20 includes: a main control section 21 for outputting the package command transmitted from the external processor 10 in the received state and transmitting measurement result data of a device 30 to be tested to the external processor 10 by one telegram; a sub-control section 22 for analyzing the package command from the main control section 21, and performing command setting based on a command content of the command for testing according to a preset setting procedure; and an error rate measurement section 23 for measuring the error rate of the device 30 to be tested according to the command content set by the sub-control section 22.

COPYRIGHT: (C)2011,JPO&INPIT


Inventors:
Eiji Takeda
Application Number:
JP2009231579A
Publication Date:
September 05, 2012
Filing Date:
October 05, 2009
Export Citation:
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Assignee:
Anritsu Co., Ltd.
International Classes:
G01R31/319; H04L1/00
Domestic Patent References:
JP2008014916A
JP2001522049A
Attorney, Agent or Firm:
Norimitsu Nishimura
Noriyuki Suzuki



 
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