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Title:
粒度分布評価方法及びそのプログラム並びに粒度分布評価装置
Document Type and Number:
Japanese Patent JP5228718
Kind Code:
B2
Abstract:

To provide a method for evaluating particle size distribution wherein the object is a particle dispersion in which particles are dispersed in a medium, while the method does not use an expensive laser light source or an apparatus for receiving the light, and the particle size distribution of the dispersion sample can be evaluated even in a high concentration or in a thick film state without fine adjustment of the thickness of the dispersion sample.

In the method for evaluating particle size distribution of a particle dispersion sample in which particles are dispersed in a medium, an estimated particle size distribution is calculated by an equation for albedo single particle scattering and absorption characteristics using the following: an albedo obtained from an actual measurement value of the spectral reflectance of the particle dispersion sample when the optical film thickness is infinite; and single particle scattering and absorption characteristics for each particle size which are obtained from the complex refractive index of particles, the refractive index of the medium and a specified particle size range in the particle dispersion sample.

COPYRIGHT: (C)2010,JPO&INPIT


Inventors:
Toru Ishii
Application Number:
JP2008230858A
Publication Date:
July 03, 2013
Filing Date:
September 09, 2008
Export Citation:
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Assignee:
DIC Corporation
International Classes:
G01N15/02
Domestic Patent References:
JP2226046A
JP63269042A
JP2006138727A
JP2006032885A
Other References:
Henrik Wann Jensen. Stephen R. Marschner. Marc Levoy. Pat Hanrahan.,A Practical Model for Subsurface Light Transport,In Proceeding of SIGGRAPH 2001,2001年,511-518
Attorney, Agent or Firm:
Kono Tsuyo



 
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