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Title:
粒状材料の粒度特定方法および粒度特定システム
Document Type and Number:
Japanese Patent JP5307695
Kind Code:
B2
Abstract:

To provide a particle size specifying method and a particle size specifying system for granular materials capable of achieving highly accurate particle size specification in a short period of time in specifying particle size in a sample in which granular materials are mixed.

The particle size specifying method for specifying the particle size of the granular materials in the sample, in which the granular materials having various size and shape are mixed, includes: a step of preparing an input image by photographing the sample by an optical system means; a step of preparing a wavelet image by performing a wavelet transform by applying Laplacian-Gaussian function to the input image; a step of preparing a binary image by performing binary processing by applying a preset threshold value to the wavelet image; a step of calculating granular material information consisting of at least the size and the shape of the granular material by using the binary image; and a step of preparing a particle size distribution curve of the sample by using the granular material information.

COPYRIGHT: (C)2011,JPO&INPIT


Inventors:
Satoshi Koyama
Tsuyoshi Maruya
Hitoshi Takeda
Masatoshi Eda
Application Number:
JP2009261156A
Publication Date:
October 02, 2013
Filing Date:
November 16, 2009
Export Citation:
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Assignee:
Taisei Corporation
International Classes:
G01N15/02
Domestic Patent References:
JP2003083868A
JP2008046077A
JP2008185395A
JP6233013A
JP2008268051A
JP4006007B2
JP2006078234A
Attorney, Agent or Firm:
Yusuke Hiraki
Sekiya Mitsuo
Ishikawa Takiharu