Title:
有機ＥＬ表示パネルの検査方法及び検査システム
Document Type and Number:
Japanese Patent JP5842212
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an organic EL display panel inspection method which, even when high resistance foreign matter has gotten mixed in some organic light-emitting element, can detect the organic light-emitting element which is made to be a dark point of leakage property by the foreign matter.SOLUTION: The inspection method includes: step S21 in which all pixels of an organic EL display panel 5 are made to emit light by a first current; step S24 in which a pixel having second emission luminance differing from first emission luminance of a peripheral pixel is identified as a target pixel; step S25 in which the target pixel and the peripheral pixel are made to emit light by a second current; step S27 in which third emission luminance of the peripheral pixel and fourth emission luminance of the target pixel are calculated; and step S29 in which a check is made to see if a difference between a first luminance ratio and a second luminance ratio exceeds a prescribed value, and when the difference is found exceeding the prescribed value, an organic light-emitting element included in the target pixel is determined to be shorted.
Inventors:
Hiromitsu Yamamoto
Application Number:
JP2011198731A
Publication Date:
January 13, 2016
Filing Date:
September 12, 2011
Export Citation:
Assignee:
Joled Co., Ltd.
International Classes:
H05B33/10; H01L51/50; H05B33/12
Domestic Patent References:
| JP2011090889A | ||||
| JP2009276671A | ||||
| JP2011134489A | ||||
| JP2008064806A |
Foreign References:
| WO2011138914A1 |
Attorney, Agent or Firm:
Shuichi Yoshikawa
Masao Sakajima
Masao Sakajima