自動分析装置 - Hitachi High-Technologies Corporation

Title:

自動分析装置

Document Type and Number:

Japanese Patent JP5923314

Kind Code:

B2

More Like This:

WO/2016/196875	A COMPONENT OF A DEVICE, A DEVICE, AND A METHOD FOR PURIFYING AND TESTING BIOMOLECULES FROM BIOLOGICAL SAMPLES
JPS57110974	AUTOMATIC RADIATION MEASURING APPARATUS

Inventors:

Kenichi Nishigane
Goro Yoshida
Ryohei Ishigami

Application Number:

JP2012011536A

Publication Date:

May 24, 2016

Filing Date:

January 23, 2012

Export Citation:

Assignee:

Hitachi High-Technologies Corporation

International Classes:

G01N35/00

Domestic Patent References:

Attorney, Agent or Firm:

Kaichi International Patent Office
Kasuga Toshiaki
Inoki Yuichi

Previous Patent: 医療用具およびその製造方法

Next Patent: OBSERVATION DEVICE FOR ENDSCOPE