Title:
検査装置、検査方法、及び、プログラム
Document Type and Number:
Japanese Patent JP5924136
Kind Code:
B2
Inventors:
Masahiko Yoshida
Toshiyuki Suzuki
Shu Shinkawa
Toshiyuki Suzuki
Shu Shinkawa
Application Number:
JP2012124774A
Publication Date:
May 25, 2016
Filing Date:
May 31, 2012
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
B41J2/01
Domestic Patent References:
| JP2004276366A | ||||
| JP2004276273A | ||||
| JP2005305992A | ||||
| JP2005349595A | ||||
| JP2013248799A | ||||
| JP2015058540A | ||||
| JP2015174267A | ||||
| JP2003298949A | ||||
| JP2011101715A | ||||
| JP2002188504A | ||||
| JP10042137A | ||||
| JP2005093687A |
Foreign References:
| US20050122360 | ||||
| US20050212845 | ||||
| US20090167807 |
Attorney, Agent or Firm:
Isshiki International Patent Service Corporation