Title:
Ｘ線装置、データ処理装置及びデータ処理方法
Document Type and Number:
Japanese Patent JP6590381
Kind Code:
B2
Abstract:
From counts detected by a photon counting detector, influence of X-ray attenuation caused by physical phenomena such as beam hardening is removed or reduced in each energy bin. Based on counts detected by a photon counting detector (24), a characteristic of X-ray attenuation amounts µt is acquired for each of X-ray energy bins. This characteristic is defined by a plurality of mutually different known thicknesses t and linear attenuation coefficients µ provided in the X-ray transmission direction through a substance. This substance is composed of a material which is included in an object being imaged and which is the same in type as the object (the same type of substance) or which can be regarded as being similar to the object in terms of the effective atomic number. Correcting data for replacing the characteristic of the X-ray attenuation amounts µt by a linear target characteristic are calculated. The linear target characteristic is set to pass through the origin of a two-dimensional coordinate system having a lateral axis assigned to thicknesses t and a longitudinal axis assigned to the X-ray attenuation amounts µt. The correcting data are calculated for each of the X-ray energy bins.
Inventors:
Tsutomu Yamakawa
Shuichiro Yamamoto
Masahiro Okada
Shuichiro Yamamoto
Masahiro Okada
Application Number:
JP2017545836A
Publication Date:
October 16, 2019
Filing Date:
October 24, 2016
Export Citation:
Assignee:
Job Co., Ltd.
International Classes:
G01N23/04; A61B6/00
Domestic Patent References:
| JP2006101926A | ||||
| JP2002291729A |
Foreign References:
| WO2010061810A1 | ||||
| WO2015111728A1 | ||||
| US20060109949 |
Attorney, Agent or Firm:
Seiryu International Patent Service Corporation
Takayoshi in the daytime
Masao Sakaizawa
Takayoshi in the daytime
Masao Sakaizawa