Title:
複合型中性子及びガンマ線検出器、並びにコインシデンス検査方法
Document Type and Number:
Japanese Patent JP6637603
Kind Code:
B2
Abstract:
A method for detecting both gamma-ray events and neutron events with a common detector, where the detector includes a layer of semiconductor material adjacent one side of a glass plate and a Gd layer on an opposite side of the glass plate, between the glass plate and a layer of silicon PIN material to form an assembly that is bounded by electrodes, including a semiconductor anode on one side of the semiconductor layer, a cathode connected to the glass plate, and a Si PIN anode on a side of the Si PIN layer opposite the semiconductor anode. The method includes the steps of: (1) monitoring the electrical signal at each of the semiconductor anode and the Si PIN anode, and (2) comparing signals from the semiconductor anode and the SI PIN anode to differentiate between gamma-ray events and neutron events based on predetermined criteria.
Inventors:
Rigger, David Earl.
Wenner, Justin Gordon Adams
Kerry jones
Gosh, sidohasa
Wenner, Justin Gordon Adams
Kerry jones
Gosh, sidohasa
Application Number:
JP2018532406A
Publication Date:
January 29, 2020
Filing Date:
January 05, 2017
Export Citation:
Assignee:
RAYTHEON COMPANY
International Classes:
G01T3/08; G01T1/24
Domestic Patent References:
| JP2006329784A | ||||
| JP2011133441A |
Foreign References:
| WO2013176719A1 | ||||
| US7745800 | ||||
| US20110266643 | ||||
| EP1531344A1 |
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Shinsuke Onuki
Tadahiko Ito
Shinsuke Onuki