Title:
電子励起状態の平均寿命時間を測定するための発光寿命時間測定方法及び装置
Document Type and Number:
Japanese Patent JP6637605
Kind Code:
B2
Abstract:
An emission lifetime measuring method, in particular for measuring a mean lifetime of electronically excited states of a sample, comprises the steps of illuminating the sample with at least one excitation light pulse, time-resolved detecting an emission response from the sample and creating a temporal detector response function, and calculating the mean lifetime of the electronically excited states on the basis of the detector response function, wherein the at least one excitation light pulse is shaped such that the sample achieves an equilibrium excited steady-state including a linearly increasing or constant number of the electronically excited states, the detector response function has a linear response function section with a constant slope, and the mean lifetime (τ) of the electronically excited states is calculated on the basis of at least one of a time position of the linear response function section relative to a reference time of the at least one excitation light pulse and the slope of the linear response function section. Furthermore, an emission lifetime measuring apparatus (100) is described.
Inventors:
Thomas M. Jovin
Nathan P. Cook
Nathan P. Cook
Application Number:
JP2018536387A
Publication Date:
January 29, 2020
Filing Date:
January 13, 2016
Export Citation:
Assignee:
Max-Plank-Gezelle Shaft Tool Forderung Del Wissenschafften A.V.
International Classes:
G01N21/64
Domestic Patent References:
| JP2013534614A | ||||
| JP2009098149A |
Foreign References:
| US20030178578 |
Other References:
WON Y , et al.,High-speed confocal fluorescence lifetime imaging microscopy (FLIM) with the analog mean delay (AMD) method,OPTICS EXPRESS,2011年 2月 7日,Vol. 19, No. 4,p.3396-3405
Attorney, Agent or Firm:
Yasuhiko Murayama
Shinya Mitsuhiro
Tatsuhiko Abe
Shinya Mitsuhiro
Tatsuhiko Abe