Title:
質量分析装置及び質量分析方法
Document Type and Number:
Japanese Patent JP6773236
Kind Code:
B2
Abstract:
Provided is a mass spectrometric method including steps of transporting ions generated in an ion source 2 to a mass spectrometer section 4 through an ion optical system 3 having a plurality of ion lenses 31, 32 and 33, and detecting the ions after performing mass separation of the ions. The method further includes steps of: adjusting a voltage applied to a first ion lens 33 which is one of the ion lenses 31, 32 and 33 so that the detection sensitivity for an ion having a predetermined mass-to-charge ratio satisfies a previously specified requirement; and applying, to a second ion lens 32 which is one of the ion lenses 31, 32 and 33 except the first ion lens 33, a voltage at which a change in the ion detection sensitivity with respect to the voltage applied to the second ion lens 33 is within a previously specified range.
Inventors:
Kitano Riki
Kazuhiro Kawamura
Kazuhiro Kawamura
Application Number:
JP2019549735A
Publication Date:
October 21, 2020
Filing Date:
October 25, 2017
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/06; G01N27/62; H01J49/26
Domestic Patent References:
| JP2005274352A |
Attorney, Agent or Firm:
Kyoto International Patent Office