Title:
自動点検システム
Document Type and Number:
Japanese Patent JP6782194
Kind Code:
B2
Abstract:
An inspection target reading device includes a wireless slave station that performs communication via a wireless network, a measurement unit that measures a state of an inspection target, and an analysis unit that generates measurement data, and transmits the measurement data from the wireless slave station via the wireless network. An automatic inspection system includes a wireless master station that communicates with each inspection target reading device via the wireless network, a data acquisition unit that acquires the measurement data from each inspection target reading device through a wireless master station, a data storage unit that stores the measurement data, a determination condition storage unit that stores determination conditions related to the measurement data, and an inspection unit that outputs predetermined measurement data selected from the stored measurement data and a predetermined determination condition corresponding to the predetermined measurement data among the stored determination conditions in association with each other.
More Like This:
Inventors:
Junpei Honda
Nishimura Takuma
Hiroshige Kashihara
Hideyoshi Nakai
Yuichi Igarashi
Ryo Nakano
Nishimura Takuma
Hiroshige Kashihara
Hideyoshi Nakai
Yuichi Igarashi
Ryo Nakano
Application Number:
JP2017110157A
Publication Date:
November 11, 2020
Filing Date:
June 02, 2017
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G08C17/00; G05B23/02; G08C15/00; H04L45/122; H04Q9/00
Domestic Patent References:
| JP2006010533A | ||||
| JP2015219849A | ||||
| JP2012138044A | ||||
| JP6186140A | ||||
| JP2014203166A | ||||
| JP2015119279A |
Foreign References:
| US20160140429 |
Attorney, Agent or Firm:
Wilfort International Patent Office