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Patent Searching and Data


Title:
解析方法、解析プログラム、および解析装置
Document Type and Number:
Japanese Patent JP6792859
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an analysis method, an analysis program and an analyzer which enable characteristics of an analysis object to be easily and accurately analyzed.SOLUTION: The analysis method is provided that comprises: exciting an analysis object by applying an AC electric signal at a first frequency to a first coil to generate a first eddy current in the analysis object; measuring a first electric state quantity corresponding to a voltage generated in a second coil by a magnetic field formed due to the first eddy current; exciting the analysis object by applying an AC electric signal at a second frequency to the first coil to generate a second eddy current in the analysis object; measuring a second electric state quantity corresponding to a voltage generated in the second coil by a magnetic field formed due to the second eddy current; and analyzing thickness-direction characteristics of the analysis object on the basis of the first electric state quantity and the second electric state quantity.SELECTED DRAWING: Figure 10

Inventors:
Eiichi Sasaki
Hiroshi Tamura
Yuki Ebisawa
Yusuke Kobayashi
Koichi Takeya
Ayatsu Ayako
Suganuma Hisada
Atsushi Tanabe
Application Number:
JP2016156441A
Publication Date:
December 02, 2020
Filing Date:
August 09, 2016
Export Citation:
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Assignee:
National University Corporation Tokyo Institute of Technology
International Classes:
G01N27/72; G01B7/06; G01N27/90
Domestic Patent References:
JP63139202A
JP2009186367A
JP2011185623A
JP59054903A
JP2001235449A
JP2007327924A
JP2015169644A
JP2003240504A
JP2015099043A
JP58163806U
Foreign References:
US5889401
Attorney, Agent or Firm:
Sumio Tanai
Kazunori Onami
Shunsuke Fushimi
Nishizawa Kazumi