Title:
測定動作パラメータ調整装置、機械学習装置及びシステム
Document Type and Number:
Japanese Patent JP6829271
Kind Code:
B2
Abstract:
To provide a measurement operation parameter adjustment device and a machine learning device which allow an efficient measurement of the position where a measurement target object is set even if there are variations in the set position of the measurement target object, the size of the measurement target object, or the type of the measurement target object.SOLUTION: A machine learning device 100 of a measurement operation parameter adjustment device 1 according to an embodiment of the present invention has a machine learning device which observes measurement operation parameter data showing the measurement operation parameter of a measurement operation and measurement time data showing the time taken for the measurement operation as a status variable showing the current state of the environment and which conducts learning and makes a decision using a learning model as a model of adjustment of the measurement operation parameter according to the state variable.SELECTED DRAWING: Figure 2
Inventors:
Hiroshi Abe
Application Number:
JP2019001207A
Publication Date:
February 10, 2021
Filing Date:
January 08, 2019
Export Citation:
Assignee:
FANUC Corporation
International Classes:
G01B21/00
Domestic Patent References:
| JP2012515911A | ||||
| JP2017163782A | ||||
| JP2010217182A | ||||
| JP11201737A | ||||
| JP2015195328A | ||||
| JP2010014504A | ||||
| JP2017064910A |
Foreign References:
| US20160305777 |
Attorney, Agent or Firm:
Aiwa Patent Business Corporation