Title:
テラヘルツ波分光計測装置およびテラヘルツ波分光計測方法
Document Type and Number:
Japanese Patent JP6843013
Kind Code:
B2
Abstract:
A measurement auxiliary member is placed on an arrangement surface of a prism. A measurement object is placed on an upper surface of the measurement auxiliary member. The measurement auxiliary member totally reflects the terahertz wave input from a lower surface by the upper surface and outputs the totally-reflected terahertz wave from the lower surface. A main pulse of a terahertz wave totally reflected by the upper surface of the measurement auxiliary member without multiply-reflected inside any optical element on an optical path of the terahertz wave, and a noise pulse of a terahertz wave multiply-reflected inside any optical element on the optical path and reflected on an interface between the prism and the measurement auxiliary member, are temporally separated from each other when detecting a correlation by a terahertz wave detection element.
Inventors:
Takashi Yasuda
Youichi Kawada
Kazuki Hotta
Hironori Takahashi
Rikuyo
Atsushi Nakanishi
Tomari Wadake
Youichi Kawada
Kazuki Hotta
Hironori Takahashi
Rikuyo
Atsushi Nakanishi
Tomari Wadake
Application Number:
JP2017140001A
Publication Date:
March 17, 2021
Filing Date:
July 19, 2017
Export Citation:
Assignee:
Hamamatsu Photonics Co., Ltd.
International Classes:
G01N21/3586
Domestic Patent References:
| JP2004354246A | ||||
| JP2013238401A | ||||
| JP2004101510A |
Foreign References:
| US20060231762 | ||||
| US20150129768 | ||||
| WO2010044193A1 | ||||
| US20110205528 | ||||
| US20070170362 |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama
Masatoshi Shibata
Yoshiki Kuroki
Kenichi Shibayama
Masatoshi Shibata