Title:
光周波数コムを使ったレーザ周波数測定装置
Document Type and Number:
Japanese Patent JP6872884
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To measure a laser frequency according to averaging time (measurement time) with higher accuracy (small uncertainty).SOLUTION: Frequency measurement includes measuring averaging time (measurement time) as parameter. The present invention relates to a laser frequency measurement device which comprises an optical frequency comb 20 and a frequency stabilization laser 30, and selects averaging time for measuring the frequency having a higher measurement accuracy (small uncertainty) to measure the frequency of measuring object laser 10. In so doing, the laser frequency measurement device selects, based on variations and the like of a first beat frequency fgenerated between the optical frequency comb 20 and the frequency stabilization laser 30 and a second beat frequency fgenerated between the frequency stabilization laser 30 and the measuring object laser 10, to use the second beat frequency for the first and second beat frequencies f, f.SELECTED DRAWING: Figure 2
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Inventors:
川▲崎▼ 和彦
Application Number:
JP2016220000A
Publication Date:
May 19, 2021
Filing Date:
November 10, 2016
Export Citation:
Assignee:
Mitutoyo Corporation
International Classes:
G01R23/14; G01R23/10; H01S3/00
Domestic Patent References:
| JP2016038298A | ||||
| JP2006029821A | ||||
| JP4309277A | ||||
| JP2001274482A |
Foreign References:
| WO2005093385A1 | ||||
| US20070024855 | ||||
| US20150185141 |
Attorney, Agent or Firm:
Patent business corporation mts international patent office
Satoshi Takaya
Keisuke Matsuyama
Takashi Fujita
Shuzo Sudo
Satoshi Takaya
Keisuke Matsuyama
Takashi Fujita
Shuzo Sudo