Title:
測定装置および該装置のパラメータ設定方法
Document Type and Number:
Japanese Patent JP6925598
Kind Code:
B2
Abstract:
To allow parameter setting for a plurality of measurement channels by saving display space.SOLUTION: A measurement device 1 comprises: a setting operation unit 2 that displays, on one display screen of a display unit 6, a parameter setting screen 6a for setting a parameter required for measuring an object W to be measured and a waveform display screen 6b for displaying a measured waveform, the setting operation unit setting an active measurement channel for displaying the parameter setting screen 6a from among a plurality of measurement channels ChA, ChB, ChC, and ChD and setting On/Off of a measurement channel key 2a corresponding to each of the plurality of measurement channels; and a parameter control unit 4 that changes, in accordance with a change of the parameter, parameters of the other measurement channels when the parameter of the measurement channel set as the active measurement channel is changed in a state in which a whole measurement channel selection key 2b for selecting all of the measurement channel keys 2a in the On state is in the On state.SELECTED DRAWING: Figure 1
Inventors:
Yoshino wound
Application Number:
JP2018137893A
Publication Date:
August 25, 2021
Filing Date:
July 23, 2018
Export Citation:
Assignee:
Anritsu Co., Ltd.
International Classes:
G01R13/20; G06F3/0484
Attorney, Agent or Firm:
Norimitsu Nishimura
Noriyuki Suzuki
Noriyuki Suzuki