Title:
Ｘ線検査システムおよび検査方法
Document Type and Number:
Japanese Patent JP6942808
Kind Code:
B2
Abstract:
The present application discloses an X-ray detection system and method. The detection system includes: a beam source generator, first detectors, a second detector, a collimating device and a processor. The first detectors and the second detector are alternately arranged in a transmission direction of an object to be detected. The beam source generator is configured to emit a plurality of columns of beam signals, wherein each column of beam signals comprises a plurality of beam signals; the first detectors are configured to receive a plurality of columns of transmitted beam signals passing through the object; the collimating device is configured to perform a specificity selection from a plurality of columns of scattered beam signals passing through the object; the second detector is configured to receive scattered beam signals selected by the collimating device; and the processor is configured to determine a detection result of the object according to the plurality of columns of transmitted beam signals and the selected scattered beam signals.
Inventors:
Chang, Lee
Chen, Ji Chien
Sun, Yunda
Gin, thin
Chan, Min
Shui, Xiao Fei
Chen, Ji Chien
Sun, Yunda
Gin, thin
Chan, Min
Shui, Xiao Fei
Application Number:
JP2019545792A
Publication Date:
September 29, 2021
Filing Date:
May 16, 2019
Export Citation:
Assignee:
NUCTECH COMPANY LIMITED
International Classes:
G01N23/20; G01N23/083
Domestic Patent References:
| JP2007508561A | ||||
| JP2010060572A | ||||
| JP2008302211A | ||||
| JP63077435A |
Foreign References:
| WO2011097386A1 | ||||
| US20170176352 |
Attorney, Agent or Firm:
Mizuno Katsufumi
Makoto Ide
Hiroshi Suzawa
Hisamatsu Yosuke
Makoto Ide
Hiroshi Suzawa
Hisamatsu Yosuke