Title:
解析パラメータの推定方法
Document Type and Number:
Japanese Patent JP6945492
Kind Code:
B2
Abstract:
To accurately estimate a value of an unknown analysis parameter with the accuracy needed for executing a numerical simulation with desired accuracy of analysis.SOLUTION: An analysis parameter estimating method includes the steps of: executing a plurality of numerical simulations in which values of one or more analysis parameters Xare changed with respect to one or more observation variables Yat one or more observation points; formulating the relationship of the analysis parameters Xwith the observation variables Yon the basis of numerical simulation results; obtaining the observation value Yof the observation variable Yby performing experimental measurement on physical phenomenon; and, with the observation value Yobtained by performing Bayes estimation on the basis of statistical information of the observation value Yand the relationship of formulated Xand Y, obtaining the probability distribution of estimated values Xof the analysis parameters Xas a posterior probability distribution P(X)=P(X|Y, Y, ...,Y) of the analysis parameters X.SELECTED DRAWING: Figure 1
Inventors:
Kei Matsuoka
Masahisa Tamura
Manabu Noguchi
Kenji Amaya
Masahisa Tamura
Manabu Noguchi
Kenji Amaya
Application Number:
JP2018087421A
Publication Date:
October 06, 2021
Filing Date:
April 27, 2018
Export Citation:
Assignee:
Ebara Corporation
Ebara Environmental Plant Co., Ltd.
Ebara Environmental Plant Co., Ltd.
International Classes:
G06Q10/04; G06F30/33; G06Q50/04
Domestic Patent References:
| JP2016177682A | ||||
| JP2016027471A |
Other References:
大森 敏明,使える!統計検定・機械学習-V,システム/制御/情報,システム制御情報学会,2015年04月15日, 第59巻 第4号,33~38
Attorney, Agent or Firm:
Toru Miyamae
Shinjiro Ono
Yukio Kanegae
Naoki Ofusa
Makoto Watanabe
Shinjiro Ono
Yukio Kanegae
Naoki Ofusa
Makoto Watanabe