Title:
異常診断装置およびプログラム
Document Type and Number:
Japanese Patent JP7281394
Kind Code:
B2
Abstract:
To provide an abnormality diagnostic apparatus which can precisely determine a state of a diagnosis object device.SOLUTION: An abnormality diagnostic apparatus 100 includes: a failure mode selection unit 106 for selecting a failure mode to be detected; a teacher data generating unit 103 for generating teacher data DT for determining, based on failure detection measurement data that is data corresponding to the failure mode of a diagnosis target apparatus 10 or another apparatus, whether or not the diagnosis target apparatus 10 has any failure; a measurement item importance calculating unit 104 for calculating importance of measurement items in the failure mode based on the teacher data DT; a feature amount selecting unit 105 for selecting a part of the measurement items as a feature amount for the failure mode based on the calculated importance; an abnormality degree calculating unit 107 for calculating an abnormality degree A corresponding to the failure mode based on measurement data relating to the feature amount; and an apparatus state determining unit 108 for determining a state of the diagnosis target apparatus 10 based on the calculated abnormality degree A.SELECTED DRAWING: Figure 1
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Inventors:
Fengxiang
Okuno Higashi
Okuno Higashi
Application Number:
JP2019232052A
Publication Date:
May 25, 2023
Filing Date:
December 23, 2019
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G05B23/02
Domestic Patent References:
JP2019124984A | ||||
JP2020173551A |
Foreign References:
WO2019012653A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Isono International Patent and Trademark Office
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