Title:
温度測定装置
Document Type and Number:
Japanese Patent JP7469960
Kind Code:
B2
Abstract:
To provide a temperature measuring device capable of determining the emissivity and temperature of an object to be measured on the basis of a ratio of the radiation light subjected to multiple reflection to the radiation light not subjected to multiple reflection even when there is no allowance in an upper space of a measuring surface of the object to be measured.SOLUTION: A temperature measuring device includes: a reflection mirror 0101; a reflection stop part 0102 which stops reflection by a reflection mirror with cycle τ; a light receiving part 0103 which receives the reflected light from a temperature measuring point after light from the temperature measuring point of the object 0104 to be measured is used as a source and is reflected from a reflection mirror, and directly receives the self-luminous from the temperature measuring point at the time of stop of reflection; and an emissivity calculating part for calculating the emissivity of the temperature measuring point based on the reflected light and self-luminous.SELECTED DRAWING: Figure 1
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Inventors:
Daisuke Terada
Toru Inouchi
Toru Inouchi
Application Number:
JP2020094020A
Publication Date:
April 17, 2024
Filing Date:
May 29, 2020
Export Citation:
Assignee:
Chino Co., Ltd.
International Classes:
G01J5/00
Domestic Patent References:
| JP57019629A | ||||
| JP58058426A | ||||
| JP58006239U | ||||
| JP2245646A | ||||
| JP2085731A |
Attorney, Agent or Firm:
Ichiro Kudo