Title:
飛行時間型質量分析装置及び飛行時間型質量分析方法
Document Type and Number:
Japanese Patent JP7487846
Kind Code:
B2
Abstract:
A mode of TOFMS according to the present invention includes flight space formation electrodes (11, 12) configured to form a flight space for separating ions derived from a component contained in a sample according to a m/z, an ion detection unit (13) configured to detect ions that have flown in the flight space, voltage switching units (4, 2) configured to switch a voltage to be applied to the flight space formation electrode from a first voltage for flying ions of a first polarity to a second voltage for flying ions of a second polarity at a given switching timing, ion information acquisition units (30, 32) configured to obtain a time of flight during which the ions fly in the flight space or a m/z of the ions based on a detection result of the ions of the second polarity obtained by the ion detection unit after the voltage has been switched by the voltage switching unit, a correction information storage unit (31) configured to store correction information related to a deviation in time of flight or a m/z associated with an elapsed time from the switching timing, and a correction unit (33) configured to correct the flight time or the m/z obtained by the ion information acquisition unit according to an elapsed time from the switching timing when the detection result of the ion is obtained using the correction information stored in the correction information storage unit.
Inventors:
宮▲崎▼ 雄太
Choze Oshiro
Choze Oshiro
Application Number:
JP2023526713A
Publication Date:
May 21, 2024
Filing Date:
June 09, 2021
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/40; G01N27/62
Domestic Patent References:
| JP2020194648A |
Foreign References:
| WO2019043943A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Kyoto International Patent Office