Title:
【発明の名称】多軌道断層撮影システム
Document Type and Number:
Japanese Patent JPH05503652
Kind Code:
A
Abstract:
A tomographic inspection system which enables multiple locations within an object to be imaged without mechanical movement of the object. The object is interposed between a rotating X-ray source and a synchronized rotating detector. A focal plane within the object is imaged onto the detector so that a cross-sectional image of the object is produced. The X-ray source is produced by deflecting an electron beam onto a target anode. The target anode emits X-ray radiation where the electrons are incident upon the target. The electron beam is produced by an electron gun which includes X and Y deflection coils for deflecting the electron beam in the X and Y directions. Deflection voltage signals are applied to the X and Y deflection coils and cause the X-ray source to rotate in a circular trace path. An additional DC voltage applied to the X or Y deflection coil will cause the circular path traced by the X-ray source to shift in the X or Y direction by a distance proportional to the magnitude of the DC voltage. This causes a different field of view, which is displaced in the X or Y direction from the previously imaged region, to be imaged. Changes in the radius of the X-ray source path result in a change in the Z level of the imaged focal plane.
Inventors:
Baker, Bruce, Dee.
Adams, John, A.
Collie, Robert, Elle.
Adams, John, A.
Collie, Robert, Elle.
Application Number:
JP51476391A
Publication Date:
June 17, 1993
Filing Date:
August 27, 1991
Export Citation:
Assignee:
Four Pyes Systems Corporation
International Classes:
A61B6/00; A61B6/02; G01N23/04; H01J35/00; H01J35/30; (IPC1-7): A61B6/00; A61B6/02; G01N23/04; H01J35/00
Attorney, Agent or Firm:
Akira Asamura (3 outside)