Document Type and Number:
Japanese Patent JPWO2022070455
Kind Code:
A1
Abstract:
Provided is a technique of an automatic analyzer that can support an operator to rapidly or easily identify a cause for abnormality of measurement and to improve the abnormality. A data processing device is configured to execute the following processes of: referring to data regarding measurement of a sample by an automatic analyzer; calculating a combination of values of a plurality of factors (for example, F1 and F2) based on reaction process data, the factors being predetermined variables or measured values representing characteristics of a reaction; referring to a correspondence table including a distribution diagram and information regarding an abnormality cause candidate, the distribution diagram including a normal range region (901) and a plurality of abnormal range regions (902) that are generated by a combination of normal/abnormal ranges of the plurality of factors, and the abnormality cause candidate being associated with each of the abnormal range regions; determining an abnormal range region in the correspondence table to which the combination of the values of the plurality of factors corresponds; and outputting the information regarding the abnormality cause candidate associated with the corresponding abnormal range region to a user.
Application Number:
JP2022553438A
Publication Date:
April 07, 2022
Filing Date:
February 10, 2021
Export Citation:
