Title:
ELECTRON SPIN MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2010/041393
Kind Code:
A1
Abstract:
Provided is a method for measuring the spin resonance phenomenon of an unpaired electron to perform micro evaluation in the state observation of the charge carrier in an organic film interface while receiving light irradiation, or the light emission from an organic thin film element. Also provided are an electron spin measurement device and measurement method in order to improve the characteristics.
The electron spin measurement device of the organic thin film element is provided with: at least one sample tube (100) into which a sample (120) is inserted and which is sealed together with specific gas or with vacuum; a cavity resonator (200) into which the at least one sample tube is inserted; an electrical characteristic measurement device (310) for the characteristic evaluation of the organic thin film element which is the sample; wiring (130) for interconnecting the electrical characteristic measurement device (310) and the sample (120) in the sample tube (100); and a light receiving/emitting device (300) for performing the light irradiation to the sample (120), and/or performing the detection of the light emission from the organic thin film element, wherein the cavity resonator irradiates microwaves having the number of vibration corresponding to the Zeeman energy splitting of the unpaired electron, sweeps a magnetic field to the sample tube (100), and measures the transition between the energy levels caused by the reversal of the direction of the electron spin.
Inventors:
MARUMOTO KAZUHIRO (JP)
Application Number:
PCT/JP2009/005094
Publication Date:
April 15, 2010
Filing Date:
October 02, 2009
Export Citation:
Assignee:
UNIV TSUKUBA (JP)
MARUMOTO KAZUHIRO (JP)
MARUMOTO KAZUHIRO (JP)
International Classes:
G01N24/10
Foreign References:
| JPH05157712A | 1993-06-25 | |||
| JPH04295782A | 1992-10-20 | |||
| JP2004264092A | 2004-09-24 | |||
| JP2001174536A | 2001-06-29 | |||
| JPH0540100A | 1993-02-19 | |||
| JPH09178727A | 1997-07-11 | |||
| JP2007048529A | 2007-02-22 | |||
| JP2006278583A | 2006-10-12 | |||
| JP2002257759A | 2002-09-11 | |||
| JP2008091467A | 2008-04-17 |
Other References:
MARUMOTO KAZUHIRO ET AL.: "Spatial Extent of Wave Functions of Gate-Induced Hole Carriers in Pentacene Field-Effect Devices as Investigated by Electron Spin Resonance", PHYSICAL REVIEW LETTERS, vol. 97, no. 25, 2006, pages 256603-1 - 256603-4, XP008147280
K. MARUMO ET AL.: "Electron Spin Resonance of Field Induced Polarons in Regioregular Poly (3-alkylthiophene) Using Metal Insulator Semiconductor Diode Structures", JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, vol. 74, no. 11, 2005, pages 3066 - 3076
K. MARUMOTO ET AL.: "Spatial Extent of Wave Functions of Gate Induced Hole Carriers in Pentacene Field Effect Devices as Investigated by Electron Spin Resonance", PHYSICAL REVIEW LETTERS, vol. 97, no. 25, 2006, pages 256603 - 1,256603-4
See also references of EP 2352016A4
K. MARUMO ET AL.: "Electron Spin Resonance of Field Induced Polarons in Regioregular Poly (3-alkylthiophene) Using Metal Insulator Semiconductor Diode Structures", JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, vol. 74, no. 11, 2005, pages 3066 - 3076
K. MARUMOTO ET AL.: "Spatial Extent of Wave Functions of Gate Induced Hole Carriers in Pentacene Field Effect Devices as Investigated by Electron Spin Resonance", PHYSICAL REVIEW LETTERS, vol. 97, no. 25, 2006, pages 256603 - 1,256603-4
See also references of EP 2352016A4
Attorney, Agent or Firm:
SONOBE, Takeo et al. (JP)
Takeo Sonobe (JP)
Takeo Sonobe (JP)
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