Title:
３次元計測対象物体の表面に計測結果関連情報を投影する方法および装置
Document Type and Number:
Japanese Patent JP7088530
Kind Code:
B2
Abstract:
To provide a method and a device capable of projecting information related to measurement results on a correct position of a surface of a three-dimensional measurement target object, on the basis of the shape, position and posture of the measurement target object, when projecting the information related to measurement results on the surface of the three-dimensional measurement target object.SOLUTION: A projection mapping method, in a projection mapping device which comprises a measurement projector and a projection projector for projecting on an object a luminance value and color information corresponding to a position of a surface of the object, includes measuring three-dimensional shape of an object using the measurement projector, referring to a table which stores a corresponding coordinate of the projector corresponding to pixels of a camera and coordinate information obtained by measuring the three-dimensional shape of the object on the basis of the coordinate information of the object, determining coordinates of pixels of the projection projector corresponding to the pixels of the camera and then, from the pixels of the projection projector, projecting the luminance value and color information corresponding to the position of the surface of the object onto the surface of the object.SELECTED DRAWING: Figure 20
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Inventors:
Motoharu Fujigaki
Masatsu Otsu
Yuichi Akatsuka
Atomic Junichi
Masashi Ito
Masatsu Otsu
Yuichi Akatsuka
Atomic Junichi
Masashi Ito
Application Number:
JP2018021435A
Publication Date:
June 21, 2022
Filing Date:
February 08, 2018
Export Citation:
Assignee:
Motoharu Fujigaki
International Classes:
G09G5/00; G01B11/25; G06T7/521; G09G5/02; G09G5/10; G09G5/36; H04N5/74
Domestic Patent References:
| JP2017215374A | ||||
| JP2017015872A | ||||
| JP2010283674A |
Attorney, Agent or Firm:
Aiwa Patent Business Corporation