Title:
ABNORMALITY DETECTING METHOD AND SYSTEM SWITCHING CONTROL METHOD FOR SEMICONDUCTOR SWITCH
Document Type and Number:
Japanese Patent JP3216731
Kind Code:
B2
Abstract:
PURPOSE: To also detect abnormality in a semiconductor switch or a firing controller therefor by inserting a current transformer between a power supply and a load and then detecting current flowing through the semiconductor switch.
CONSTITUTION: When a semiconductor switch (hereinafter, referred to an AC switch) 2 is normal, i.e., when it is turned OFF by an OFF command delivered from a firing controller 6, a command monitor 7 delivers a signal '1' to an AND gate 8 but since a current detector 5 delivers '0' to the AND gate 8, the AND gate 8 delivers no abnormality signal. On the contrary, when the AC switch 2 is abnormal, both the command monitor 7 and the current detector 5 deliver '1' to the AND gate 8 which thereby delivers an abnormality signal. Consequently, reaction of the AC switch 2 to a command delivered from the firing controller can be confirmed and abnormality can be detected upon turn OFF of the AC switch 2.
Inventors:
Kazuki Hosaka
Application Number:
JP19733292A
Publication Date:
October 09, 2001
Filing Date:
July 24, 1992
Export Citation:
Assignee:
Fuji Electric Co., Ltd.
International Classes:
H02H7/20; H02J3/04; H02J9/04; (IPC1-7): H02J3/04; H02H7/20; H02J9/04
Domestic Patent References:
| JP6152105A | ||||
| JP60160040A | ||||
| JP60160041A | ||||
| JP5020222A |
Attorney, Agent or Firm:
Masaharu Shinobe