Title:
AMORPHOUS PHASE QUANTITATIVE ANALYZER AND AMORPHOUS PHASE QUANTITATIVE ANALYSIS METHOD AND COMPUTER PROGRAM
Document Type and Number:
Japanese Patent JP2023118498
Kind Code:
A
Abstract:
To provide an amorphous phase quantitative analyzer, an amorphous phase quantitative analysis method, and a computer program that can quantify an amorphous phase in a sample containing both crystalline and amorphous phases.SOLUTION: An amorphous phase quantitative analyzer for quantifying an amorphous phase in a sample containing both crystalline and amorphous phases is characterized that it comprises a sample preparation part for measurement that prepares a sample for measurement by adding a standard substance to the sample, an x-ray diffraction measurement part that measures a quantitative value Xa of the crystal phase and a quantitative value Xs of the standard substance contained in the sample for measurement by an x-ray diffraction method, an arithmetic processing part that quantifies a mass fraction Mb of the amorphous phase by calculating a mass fraction Ma of the crystalline phase based on a mass fraction Ms of the standard substance, the quantitative value Xs of the standard substance, and the quantitative value Xa of the crystalline phase, and an output part that displays and outputs a result of the quantitative analysis of the sample.SELECTED DRAWING: Figure 1
Inventors:
MATSUDO HITOSHI
TOMATSU ICHIRO
KOIKE YASUTA
TOMATSU ICHIRO
KOIKE YASUTA
Application Number:
JP2022021473A
Publication Date:
August 25, 2023
Filing Date:
February 15, 2022
Export Citation:
Assignee:
TOKYO YOGYO KK
International Classes:
G01N23/2055
Attorney, Agent or Firm:
Patent Attorney Ginza Maronnier Patent Office
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