Title:
ABNORMALITY DETECTION SYSTEM AND METHOD
Document Type and Number:
Japanese Patent JP2022190376
Kind Code:
A
Abstract:
To provide an abnormality detection system and method capable of performing a more stable abnormality detection.SOLUTION: An abnormality detection system 1 for detecting an abnormality in a target machine 2 using a computer comprises: a communication unit that acquires first data D0 from a first sensor 11 attached to the target machine and acquires second data D1 from a second sensor 12 attached to the target machine; a calculation unit, and a storage unit, wherein the calculation unit comprises: a coding unit 13 that is learned to generate a latent expression including a predetermined latent expression for estimating the second data based on the first data; a decoding unit 14 that is learned to restore the first data from the latent expression; and an abnormality detection unit 16 for detecting an abnormality in the target machine based on a restoration error between the first data and the first data restored by the decoding unit.SELECTED DRAWING: Figure 1
Inventors:
DOHI KOTA
HARSH PRAMODBHAI PUROHIT
TANABE AKIRA
YAMAMOTO MASAAKI
ENDO TAKASHI
KAWAGUCHI YOHEI
HARSH PRAMODBHAI PUROHIT
TANABE AKIRA
YAMAMOTO MASAAKI
ENDO TAKASHI
KAWAGUCHI YOHEI
Application Number:
JP2021098665A
Publication Date:
December 26, 2022
Filing Date:
June 14, 2021
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G05B23/02
Attorney, Agent or Firm:
Patent Attorney Corporation Wilfort International Patent Office